Keithley 590

Keithley 590

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Location:Hounslow, United Kingdom

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Description

C-V Analyser with option 5902 The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing. High frequency (100kHz or 1MHz) C-V measurements are commonly applied to test p-n or schottky junction and Metal-Insulator-Semiconductor (MIS) devices for device characterization and process control. C-V results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation • 100kHz, 1MHz, or 100kHz/1MHz test structures. Measure C-V and C-t, Not Just Capacitance C-V and C-t data are used to determine important characteristics such as semiconductor doping profiles, threshold voltage, oxide characteristics, mobile ion density, interface trap density, and minority carrier lifetime.

Specifications

ManufacturerKeithley
ModelKeithley 590
ConditionUsed